SPM6500 Scanning probe microscopes

SPM-6500 allows for advanced digital controls for both STM and AFM scanning modes.

Standard:

Atomic Force Microscope (AFM): Contact Mode,Tapping Mode, Phase Imaging

Lateral Force Microscope (LFM)

Scanning Tunneling Microscope (STM)

Curve Measurement: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve

Optional:

Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode

Magnetic Force Microscope (MFM) / Electric Force Microscope (EFM)

Enviornmental Control SPM

SPM in liquid

Conductive AFM

Enviornmental Control SPM  ......

Specifications • Functions  Atomic Force Microscope (AFM) which has full coverage of Contact Mode, Tapping Mode, Phase Imaging and Lift Mode;  Lateral Force Microscope (LFM);  Scanning Tunneling Microscope (STM);  Conductive AFM, SPM in liquid, Enviornmental Control SPM;  Nano-Processing System including Lithography Mode and Vector Scan Mode; • Resolution AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical;  • Technical Parameters Current Sensitivity: ≤10pA; Force Sensitivity: ≤5pN; Image Pixels: 128×128, 256×256, 512×512, 1024×1024, 2048×2048; Scan Angle: 0-360° adjustable; Scan Rate: 0.1-100Hz adjustable; Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V; Temperature Sensitivity: 0.1°C, Humidity Sensitivity: 0.5%RH• Electronics  CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; DAC: 20 channels of 16-bit DAC;  ADC: 20 channels of 16-bit ADC;  Communication Interface: 10M/100M Fast Ethernet;  • Mechanics Sample Size: Up to 50mm×50mm, 30mm thick; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm • Softwares Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x;

 Scanning Tunneling Microscopy (STM)The scanning tunneling microscope is a non-optical microscope that scans an electrical probe over a surface to be imaged to detect a weak electric current flowing between the tip and the surface.

Atomic Force Microscope (AFM)Atomic Force Microscope, a device designed for imaging of surfaces, not necessarily conducting. This is the main advantage of AFM over scanning tunneling microscope which can be applied to image only conducting materials and their surfaces.By different tip-sample forces and distances, AFM Includes:

Contact ModeContact mode is the most common method of operation of the AFM. As the name suggests, the tip and sample remain in close contact as the scanning proceeds. Tapping ModeTapping mode is the next most common mode used in AFM. When operated in air or other gases, the cantilever is oscillated at its resonant frequency  and positioned above the surface so that it only taps the surface for a very small fraction of its oscillation period. This is still contact with the sample in the sense defined earlier, but the very short time over which this contact occurs means that lateral forces are dramatically reduced as the tip scans over the surface. When imaging poorly immobilised or soft samples, tapping mode may be a far better choice than contact mode for imaging.

Phase ImagingPhase Imaging works by measuring the phase difference between the oscillations of the cantilever driving piezo and the detected oscillations. It is thought that image contrast is derived from image properties such as stiffness and viscoelasticiy.

  Lift ModeSeveral techniques in AFM rely on removing topographical information from some other signal. Magnetic force imaging and Electric force imaging work by first determining the topography along a scan line, and then lifting a pre-determined distance above the surface to re-trace the line following the contour of the surface. In this way, the tip-sample distance should be unaffected by topography, and an image can be built up by recording changes which occur due to longer range force interactions, such as magnetic forces.  

 

SPM6500 Scanning probe microscopes